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Local variations in the critical current degradation of Ag/Bi2223 tape by tensile and bending strains
K. Katagiri*, H. S. Shin, K. Kasaba, T. Tsukinokizawa, K. Hiroi, T. Kuroda, K. Itoh, H. Wada
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
43
Scopus
citations