Influence of ITO patterning on reliability of organic light emitting devices

Zhaokui Wang; Shigeki Naka; Hiroyuki Okada

doi:10.1016/j.tsf.2009.07.029

Influence of ITO patterning on reliability of organic light emitting devices

Zhaokui Wang, Shigeki Naka, Hiroyuki Okada^*

^*Corresponding author for this work

Electric and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Indium tin oxide (ITO) films are widely used for a transparent electrode of organic light emitting devices (OLEDs) because of its excellent conductivity and transparency. Two types of ITO substrates with different surface roughness were selected to use as anode of OLEDs. In addition, two types of etching process of ITO substrate, particularly the etching time, were also carried out. It was found that the surface roughness and/or the etching process of ITO substrate strongly influenced on an edge of ITO surface, further affected the operating characteristics and reliability of devices.

Original language	English
Pages (from-to)	497-500
Number of pages	4
Journal	Thin Solid Films
Volume	518
Issue number	2
DOIs	https://doi.org/10.1016/j.tsf.2009.07.029
State	Published - 2009/11/30

Keywords

Indium tin oxide (ITO)
Organic light emitting device (OLED)
Patterning
Surface roughness

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2009.07.029

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title = "Influence of ITO patterning on reliability of organic light emitting devices",

abstract = "Indium tin oxide (ITO) films are widely used for a transparent electrode of organic light emitting devices (OLEDs) because of its excellent conductivity and transparency. Two types of ITO substrates with different surface roughness were selected to use as anode of OLEDs. In addition, two types of etching process of ITO substrate, particularly the etching time, were also carried out. It was found that the surface roughness and/or the etching process of ITO substrate strongly influenced on an edge of ITO surface, further affected the operating characteristics and reliability of devices.",

keywords = "Indium tin oxide (ITO), Organic light emitting device (OLED), Patterning, Surface roughness",

author = "Zhaokui Wang and Shigeki Naka and Hiroyuki Okada",

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doi = "10.1016/j.tsf.2009.07.029",

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T1 - Influence of ITO patterning on reliability of organic light emitting devices

AU - Wang, Zhaokui

AU - Naka, Shigeki

AU - Okada, Hiroyuki

PY - 2009/11/30

Y1 - 2009/11/30

N2 - Indium tin oxide (ITO) films are widely used for a transparent electrode of organic light emitting devices (OLEDs) because of its excellent conductivity and transparency. Two types of ITO substrates with different surface roughness were selected to use as anode of OLEDs. In addition, two types of etching process of ITO substrate, particularly the etching time, were also carried out. It was found that the surface roughness and/or the etching process of ITO substrate strongly influenced on an edge of ITO surface, further affected the operating characteristics and reliability of devices.

AB - Indium tin oxide (ITO) films are widely used for a transparent electrode of organic light emitting devices (OLEDs) because of its excellent conductivity and transparency. Two types of ITO substrates with different surface roughness were selected to use as anode of OLEDs. In addition, two types of etching process of ITO substrate, particularly the etching time, were also carried out. It was found that the surface roughness and/or the etching process of ITO substrate strongly influenced on an edge of ITO surface, further affected the operating characteristics and reliability of devices.

KW - Indium tin oxide (ITO)

KW - Organic light emitting device (OLED)

KW - Patterning

KW - Surface roughness

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DO - 10.1016/j.tsf.2009.07.029

M3 - 学術論文

AN - SCOPUS:70349974979

SN - 0040-6090

VL - 518

SP - 497

EP - 500

JO - Thin Solid Films

JF - Thin Solid Films

IS - 2

ER -

Influence of ITO patterning on reliability of organic light emitting devices

Abstract

Keywords

ASJC Scopus subject areas

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