In situ X-ray diffraction measurements of the self-preservation effect of CH4 hydrate

Satoshi Takeya*, Wataru Shimada, Yasushi Kamata, Takao Ebinuma, Tsutomu Uchida, Jiro Nagao, Hideo Narita

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

167 Scopus citations

Abstract

In situ observations of CH4 hydrate dissociation using X-ray diffraction were carried out at atmospheric pressure and at both 168 and 189 K. Dissociation rates of the hydrate and the rate of transformation into hexagonal ice were measured using time-resolved energy-dispersive X-ray diffraction. The dissociation of CH4 hydrate had an initially fast regime followed by slower dissociation. Thus, the data support a previously suggested two-step process. In addition, we observed dynamic behavior of the X-ray diffraction intensities of ice Ih, which implies a transient crystal structure at the beginning of the dissociation. Our analyses indicates that the first step, which lasted several tens of minutes, was the formation of an ice Ih layer around the CH4 hydrate, and the second step was relatively slow because the CH4 had to diffuse through the thickening ice layer. This second step determined the hydrate lifetime. The resulting diffusion coefficients were estimated at 2.2 × 10-11 m2/s at 189 K and 9.6 × 10-12 m2/s at 168 K.

Original languageEnglish
Pages (from-to)9756-9759
Number of pages4
JournalJournal of Physical Chemistry A
Volume105
Issue number42
DOIs
StatePublished - 2001/10/25

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

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