Keyphrases
(001) Substrate
33%
AlSb
100%
Antimony
16%
Atomic Force Microscopy
16%
Auger Electron Spectroscopy
16%
Buffer Layer
100%
Crystal Quality
33%
Diffraction Force
16%
Electrical Properties
16%
Growth Temperature
50%
Heteroepitaxial Growth
100%
Indium
16%
InSb
100%
Large Lattice Mismatch
16%
Optimized Growth
16%
Si(111)
100%
Smooth Surface
16%
Stoichiometric Composition
16%
Surface Morphology
16%
X Ray Diffraction
16%
Physics
Atomic Force Microscopy
100%
Chemical Element
100%
Electrical Property
100%
Electron Spectroscopy
100%
Indium
100%
Lattice Mismatch
100%
X-Ray Diffraction
100%
Material Science
Antimony
16%
Auger Electron Spectroscopy
16%
Buffer Layer
100%
Film
100%
Indium
16%
Lattice Mismatch
16%
Phase Composition
16%
Surface (Surface Science)
16%
Surface Morphology
16%
X-Ray Diffraction
16%