Abstract
The pulsed intense ion beam, emitted from a dense plasma focus (DPF) discharges performed with hydrogen gas, has been used to ablate the graphite target depositing diamond-like carbon (DLC) films on Si substrates. The substrates were mounted on a holder, which allowed for deposition at positions between normal and 20° off-normal to the target. The samples were removed for analysis after 10 and 20 shots. Nano-particles were observed in the films by a field-emission scanning electron microscope. Raman spectra indicate that sample deposited at 20° off-normal with 20 shots possesses the highest sp3 content among the samples. The film deposited at this position was also found has the highest hardness.
Original language | English |
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Pages (from-to) | 4169-4173 |
Number of pages | 5 |
Journal | Physics Letters, Section A: General, Atomic and Solid State Physics |
Volume | 373 |
Issue number | 45 |
DOIs | |
State | Published - 2009/11/02 |
Keywords
- Dense plasma focus (DPF)
- Diamond-like carbon (DLC)
- Pulsed ion beam ablation
ASJC Scopus subject areas
- General Physics and Astronomy