Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole

P. Lablanquie*, S. Sheinerman, F. Penent, R. I. Hall, M. Ahmad, Y. Hikosaka, K. Ito

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

Two electron Auger decay of the 4d innershell hole in xenon formed by photon absorption leading to the emission of a slow and a fast electron was observed in the threshold region. The observed line shapes of the fast electron are strongly affected by PCI. Theory showed that these line shapes depend on the nature and dynamics of the decay process. It was determined that two electron Auger decay is dominated by the cascade process with initial ejection of the slow electron.

Original languageEnglish
Article number053001
Pages (from-to)053001/1-053001/4
JournalPhysical Review Letters
Volume87
Issue number5
StatePublished - 2001/07/30

ASJC Scopus subject areas

  • General Physics and Astronomy

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