Abstract
Two electron Auger decay of the 4d innershell hole in xenon formed by photon absorption leading to the emission of a slow and a fast electron was observed in the threshold region. The observed line shapes of the fast electron are strongly affected by PCI. Theory showed that these line shapes depend on the nature and dynamics of the decay process. It was determined that two electron Auger decay is dominated by the cascade process with initial ejection of the slow electron.
Original language | English |
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Article number | 053001 |
Pages (from-to) | 053001/1-053001/4 |
Journal | Physical Review Letters |
Volume | 87 |
Issue number | 5 |
State | Published - 2001/07/30 |
ASJC Scopus subject areas
- General Physics and Astronomy