TY - GEN
T1 - Correlation between contact angle and electrical properties in pentacene and C6-DNT-V-based organic thin film transistors
AU - Shaari, Safizan
AU - Naka, Shigeki
AU - Okada, Hiroyuki
N1 - Publisher Copyright:
© 2016 FTFMD.
PY - 2016/8/15
Y1 - 2016/8/15
N2 - We have fabricated pentacene and C6-DNT-V-based organic thin film transistors (OTFTs) with various types of interfacial layer. Eight different kinds of OTFTs were fabricated without and with interfacial layers (CT4112, PMMA, Cytop, OTS, HMDS, Ta2O5 and Si3N4). The surface properties of contact angle and electrical properties of OTFTs include charge carrier mobility, threshold voltage, and on/off current ratio were measured to compare and analyse the relationship between them. Some of the device properties show strong correlations, especially the relationship between contact angle and threshold voltage shows the strong correlation coefficient compare with others relationship. Correlation coefficient (R) between contact angle and threshold voltage was 0.83 for the pentacene and 0.88 for the C6-DNT-V-based OTFTs.
AB - We have fabricated pentacene and C6-DNT-V-based organic thin film transistors (OTFTs) with various types of interfacial layer. Eight different kinds of OTFTs were fabricated without and with interfacial layers (CT4112, PMMA, Cytop, OTS, HMDS, Ta2O5 and Si3N4). The surface properties of contact angle and electrical properties of OTFTs include charge carrier mobility, threshold voltage, and on/off current ratio were measured to compare and analyse the relationship between them. Some of the device properties show strong correlations, especially the relationship between contact angle and threshold voltage shows the strong correlation coefficient compare with others relationship. Correlation coefficient (R) between contact angle and threshold voltage was 0.83 for the pentacene and 0.88 for the C6-DNT-V-based OTFTs.
UR - http://www.scopus.com/inward/record.url?scp=84987652806&partnerID=8YFLogxK
U2 - 10.1109/AM-FPD.2016.7543650
DO - 10.1109/AM-FPD.2016.7543650
M3 - 会議への寄与
AN - SCOPUS:84987652806
T3 - Proceedings of AM-FPD 2016 - 23rd International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials
SP - 160
EP - 162
BT - Proceedings of AM-FPD 2016 - 23rd International Workshop on Active-Matrix Flatpanel Displays and Devices
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2016
Y2 - 6 July 2016 through 8 July 2016
ER -