TY - JOUR
T1 - Characterization of State-Preparation Uncertainty in Quantum Key Distribution
AU - Huang, Anqi
AU - Mizutani, Akihiro
AU - Lo, Hoi Kwong
AU - Makarov, Vadim
AU - Tamaki, Kiyoshi
N1 - Publisher Copyright:
© 2023 American Physical Society.
PY - 2023/1
Y1 - 2023/1
N2 - To achieve secure quantum key distribution, all imperfections in the source unit must be incorporated in a security proof and measured in the lab. Here we perform a proof-of-principle demonstration of the experimental techniques for characterizing the source phase and intensity fluctuation in commercial quantum key distribution systems. When we apply the measured phase-fluctuation intervals to the security proof that takes into account fluctuations in the state preparation, it predicts a key distribution distance of over 100km of fiber. The measured intensity fluctuation intervals are, however, so large that the proof predicts zero key, indicating a source improvement may be needed. Our characterization methods pave the way for a future certification standard.
AB - To achieve secure quantum key distribution, all imperfections in the source unit must be incorporated in a security proof and measured in the lab. Here we perform a proof-of-principle demonstration of the experimental techniques for characterizing the source phase and intensity fluctuation in commercial quantum key distribution systems. When we apply the measured phase-fluctuation intervals to the security proof that takes into account fluctuations in the state preparation, it predicts a key distribution distance of over 100km of fiber. The measured intensity fluctuation intervals are, however, so large that the proof predicts zero key, indicating a source improvement may be needed. Our characterization methods pave the way for a future certification standard.
UR - http://www.scopus.com/inward/record.url?scp=85147540268&partnerID=8YFLogxK
U2 - 10.1103/PhysRevApplied.19.014048
DO - 10.1103/PhysRevApplied.19.014048
M3 - 学術論文
AN - SCOPUS:85147540268
SN - 2331-7019
VL - 19
JO - Physical Review Applied
JF - Physical Review Applied
IS - 1
M1 - 014048
ER -