Characterization of Al 2O 3/InSb/Si MOS diodes having various InSb thicknesses grown on Si(111) substrates

Azusa Kadoda*, Tatsuya Iwasugi, Kimihiko Nakatani, Koji Nakayama, Masayuki Mori, Koichi Maezawa, Eiji Miyazaki, Takashi Mizutani

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Characterization of Al 2O 3/InSb/Si MOS diodes having various InSb thicknesses grown on Si(111) substrates'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science