Keyphrases
(001) Substrate
27%
Active Transmission
6%
Adsorption
9%
AlSb
13%
Aluminum Oxide
10%
Annealing
6%
Array Structure
5%
Buffer Layer
26%
Channel Layer
7%
Circuit Simulation
5%
Crystal Quality
11%
Delta-sigma Modulation
17%
Delta-sigma Modulator
8%
Electrical Properties
8%
Epitaxy
7%
Experimental Demonstration
5%
Flux Ratio
7%
GaSb
8%
GaSb Film
8%
Ge Buffer
7%
Growth Temperature
10%
Growth Temperature Effects
6%
Harmonic Oscillator
6%
Heteroepitaxial Growth
34%
Heteroepitaxial Structures
8%
Heteroepitaxy
11%
High Performance
10%
Higher Harmonics
6%
InGaSb
8%
InSb
100%
Microphone Sensor
10%
Nanoclusters
10%
Oscillation Frequency
9%
Oscillator Basis
10%
Reflection High-energy Electron Diffraction
6%
Resonant Tunneling
12%
Resonant Tunneling Diode
43%
Si Substrate
6%
Si(111)
84%
Si(111) Substrate
23%
SiGe
9%
Super-regenerative
6%
Surface Morphology
8%
Surface Phase
14%
Surface Reconstruction
20%
Transmission Line
10%
Two-step Growth
7%
Two-step Growth Method
8%
Ultrathin
6%
X Ray Diffraction
7%
Material Science
Auger Electron Spectroscopy
6%
Buffer Layer
33%
Density
5%
Electron Mobility
7%
Electronic Circuit
25%
Epitaxy
7%
Film
93%
Heteroepitaxy
11%
Heterojunction
8%
Lattice Mismatch
8%
Metal-Oxide-Semiconductor Field-Effect Transistor
7%
Microelectromechanical System
6%
Molecular Beam Epitaxy
5%
Monolayers
11%
Nanoclusters
10%
Reflection High-Energy Electron Diffraction
12%
Resonator
18%
Surface (Surface Science)
46%
Surface Morphology
10%
Surface Reconstruction
24%
Thin Films
8%
X-Ray Diffraction
14%
Engineering
Buffer Layer
7%
Channel Layer
10%
Crystal Quality
14%
Digital Signal
5%
Dynamic Range
6%
Electric Lines
13%
Energy Electron Diffraction
5%
Growth Condition
7%
Growth Method
8%
Harmonics
11%
Heterojunctions
5%
High Resolution
5%
Induced Surface
7%
Lattice Mismatch
11%
Low Growth Rate
5%
Metal-Oxide-Semiconductor Field-Effect Transistor
11%
Microelectromechanical System
6%
Monolayers
6%
Oscillator
28%
Phase Noise
5%
Quantum Well
6%
Resonant Tunneling
43%
Resonator
12%
Scanning Tunneling Microscopy
9%
Si Substrate
9%
Substrate Temperature
6%
Surface Morphology
8%
Surface Phase
17%
Thin Films
5%
